Dr. Comes Presents Invited Talk at Gordon Conference

GRC 2018 Group Photo

Dr. Comes presented an invited talk at the Gordon Conference on Defects in Semiconductors at Colby-Sawyer College last week discussing the role that defects play at the LaFeO3-SrTiO3 interface and presenting some of the first results from the new FINO Lab MBE and XPS. It was a great crowd and lively discussion!