Patents Granted by US Patent and Trademark Office:
Wang J. & He Q.P., Enhanced state estimation method based on information credibility, US Patent 8,515,567, issued on August 20, 2013.
Wang J., Chong R.J. , Bode C.A. , Qin S.J. & Pasadyn A.J., Applying a self-adaptive filter to a drifting process, US Patent # 7,424,392, issued on September 9, 2008
He Q.P., Wang J. & Bode C.A., Method and apparatus for fast disturbance detection and classification, US Patent # 7,299,154, issued on November 20, 2007
Wang J. & Cherry G.A., Adjusting a sampling protocol in an adaptive control process, US Patent # 7,050,879, issued on May 23, 2006
Wang J. & Cherry G.A., Fault detection and classification based on calculating distances between data points, US Patent # 7,043,403, issued on May 9, 2006
Jenkins N.M., Wang J., Markle R.J., Coss, E. & Cusson B.K., Conflict resolution among multiple controllers, US Patent # 7,031,793, issued on April 18, 2006
Good R.P., Cherry G.A. & Wang J., Probability constrained optimization for electrical fabrication control, US Patent # 6,959,224, issued on October 25, 2005
Chong R.J. & Wang J., Method and apparatus for controlling a fabrication process based on a measured electrical characteristic, US Patent # 6,912,437, issued on June 28, 2005
Sonderman T.J., Wang J., Jenkins, N.M. & Coss, C., Process control based upon a metrology delay, US Patent # 6,834,213, issued on December 21, 2004
Chong R.J., Green E.O. & Wang J., Process control based on tool health data, US Patent # 6,804,619, October 12, 2004
Wang J., Coss E., Cusson B.K., Pasadyn A.J., Miller M.L., Jenkins N.M. & Bode C.A., Identifying a cause of a fault based on a process controller output, US Patent # 6,778,873, issued on August 17, 2004
Pasadyn A.J., Sonderman T.J. & Wang J., Dynamic targeting for a process control system, US Patent # 6,773,931, issued on August 10, 2004
Wang J. & Cusson B.K., Adjusting a sampling rate based on state estimation results, US Patent # 6,766,214, issued on July 20, 2004
Wang, J. and Cusson, B.K. “Adjusting a sampling rate based on state estimation results” US Patent # 6,766,214, issued on July 20, 2004
Patents Pending at US Patent and Trademark Office
Wang J., He Q.P., A process monitoring framework based on statistics patterns, US Provisional Patent Application # 61/296,302, filed January 18, 2010.
Wang J., He Q.P., Galicia H., Hodges R.E, Krishnagopalan G.A and Cullinan H.T., A subspace identification based dynamic soft sensor approach for digester control, US Provisional Patent Application # 61259462, filed on November 13, 2009.